Publications

1. S. Mróz, M. Stęślicka, J. Stęślicki, A New Method for Obtaining Tungsten Emitters Adaptable for Use with the Field Emission Microscopes, Acta Universitatis Wratislaviensis No 18 (1963) 57.
2. S. Mróz, E. Chrzanowski, Metod izmierienija temperatury awtoelektronnych emitterow, Pribory i Tiechnika Ekspierimienta No 4 (1968) 176.
3. S. Mróz, An Investigation of Thermal Vibrations of Atoms on the (001) Surface of Nickel Applying the Low-Energy Electron Diffraction (LEED Method), Acta Phys. Polon; A38 (1970) 321.
4. S. Mróz, S. Kaszczyszyn, Toczecznyj mikrofotomietr dla izmierienija intiensiwnosti difrakcionnych puczkow w difrakcii elektronow nizkoj eniergii, Pribory i Tiechnika Ekspierimienta N 5 (1970) 204.
5. S. Mróz, Stieklannaja kamiera dlia nabliudienija difrakcii elektronow nizkoj eniergii, Pribory i Tiechnika Ekspierimienta No 3 (1971) 205.
6. J. Kołaczkiewicz, C. Kozioł, S. Mróz, An Investigation of Impurities Segregation to the (001) Nickel Surface during Thermal Treatment. Work Function Changes and Auger Electron Spectroscopy using the LEED Camera, Acta Phys. Polon. A41 (1972) 783. Streszczenie pracy zamieszczone jest również w materiałach EPS Conference "Metal Surfaces”, Hindas, Szwecja, 1973.
7. S. Kaszczyszyn, S. Mróz, Układ do spektroskopii elektronów Augera z wykorzystaniem optyki elektronowej kamery LEED, Prace Instytutu Technologii Elektronowej I (1973) 298.
8. J. Kołaczkiewicz, C. Kozioł, S. Mróz, Wykorzystanie szklanej kamery LEED do pomiaru zmian pracy wyjścia metodą wiązki elektronów, Prace Instytutu Technologii Elektronowej I (1973) 291.
9. S. Mróz, S. Kaszczyszyn, E. Chrzanowski, J. Kołaczkiewicz, Konstrukcja i parametry unipolarnego filtru mas, Materiały II-ej Krajowej Konferencji "Technika próżni i jej zastosowanie w przemyśle i w badaniach naukowych”, Bolesławiec - Swieradów Zdrój 1973, str. 150.
10. S. Mróz, S. Kaszczyszyn, Ł. Żyłka, Sostaw puczka ceolitowogo istocznika ionow Cs, Pribory i Tiechnika Ekspierimienta, No 5 (1974) 137.
11. S. Mróz, Badanie właściwości powierzchni (001) niklu za pomocą, dyfrakcji powolnych elektronów, spektroskopii elektronów Augera i pomiaru zmian pracy wyjścia metodą wiązki elektronów, Acta Universitatis Wratislaviensis 249 (1975) 67.
12. S. Mróz, J. Kołaczkiewicz, T. Kucharzak, Urządzenie do obserwacji dyfrakcji powolnych elektronów z przeznaczeniem dla pracowni studenckiej, Postępy Fizyki 26 (1975) 223.
13. S. Mróz, LEED Studies of Thermal Vibrations of Atoms on the (111) Nickel Surface by the Alternating Current Method, Surface Science 51 (1975) 365.
14. S. Mróz, Zastosowanie próżni w badaniu procesu czyszczenia powierzchni niklu, wolframu i miedzi, Referaty i Komunikaty (streszczenia) III-ciej Krajowej Konferencji "Technika Próżni w przemyśle i w badaniach naukowych", Mielno-Koszalin (1975) 136.
15. S. Mróz, G, Jaworska, Primienienije Oże-elektronnoj spiektroskopii dlia kontrolia prociessa oczistki powierchnosti (110) nikiela bombardirowkoj jonami kalija, -"X-Ray Photoelectron Spectroscopy", Kiev, „Naukova Dumka", (1977) 143.
16. .S. Mróz, C. Kozioł, J. Kołaczkiewicz, Carbon and Sulphur on the (111) and (001) Faces of Nickel during the Thermal Treatment in Ultra-high Vacuum and in the Oxygen Atmosphere, Vacuum 26, 2 (1976) 61.
17. S. Mróz, A. Mróz, Sulphur and Phosphorus on the (110) Face of Nickel during Thermal Treatment in Ultra-high Vacuum , Proc. 6-th Czechoslovak Conference on Electronics and Vacuum Physics, Bratyslava, vol. 4 (1976) 228.
18. S. Mróz, A. Mróz, Z. Sidorski, Copper Adsorption on the (112) Face of Tungsten, Proc. 7-th Intern. Vacuum Congr. and Inter. Conf. Solid Surfaces, Vienna, (1977) 1125.
19. S. Mróz, C. Kozioł, On the Structure of the Sulphur Layer adsorbed on the (110) Nickel Face, Acta Crystallographica A34, part S4 (1978) sect. A Suppl., p. 203 (Proc. of Eleventh International Congress of Crystallography, Warszawa (1978).
20. S. Mróz, On the Structure of the Sulphur Layer Adsorbed on the (110) Nickel Face, Surface Science 83 (1979) L 625.
21. J. G. Ociepa, S, Mróz, The adsorption of Lanthanum Hexaboride on Tantalum, Vacuum 29, 6-7 (1979) 241.
22. A. Mróz, S. Mróz, The Thermal Vibrations of Atoms on the (110) Nickel Face and their Anisotropy, Acta Universitatis Wratislaviensis No 561 (1980) 7.
23. P Godowski, J. Kołaczkiewicz, S. Mróz, W. Wiejak, Studies of the Appearance of Sulphur on the Nickel Surface during Heating of the Sample in Ultra-high Vacuum, Acta Universitatis Wratislaviensis No 561 (1980) 15.
24. J.G. Ociepa, S. Mróz, Composition of the Species Evaporated from the LaB6 Source as a Function of the Source Temperature, Acta Universitatis Wratislaviensis No 56l (1980) 25.
25. S. Mróz, Self-made LEED-AES Metallic Camera and Its Application to the Inyestigation of Sulphur Segregation to (110) Nickel Face, Atomki Kozlemenyek 22, 1 (1980) 17 (Proc. of the ESCA Seminar of Socialist Countries, Debrecen, Węgry, 1980.
26. C. Kozioł, S. Mróz, On the Structure of Sulphur Adsorbed on the (110) Nickel Face, Proc. of the Fourth International Conference on Solid Surfaces and the Third European Conference on Surface Science, Cannes, Francja, vol. I (1980), 299. (Supplement de la Revue”Le Vide, les Couches Minces” No 201).
27. S. Mróz, Sulphur Appearance on the (110) Ni Face Induced by Electron Bombardment, Surface Science 102 (1981) L 71.
28. S. Mróz, A. Mróz, LEED Measurements of the Surface Debye Temperature for the (110) Nickel Face, Surface Science 109 (1981) 444.
29. J. G. Ociepa, S. Mróz, Properties of Very Thin La-B Films Deposited on Tantalum Thin Solid Films 85 (1981) 43.
30. S. Mróz, A. Grudniewski, E. Bąk, Determination of the Incidence and Azimuth Angles in LEED Experiments, Journal of Physics E 16 (1983) 858.
31. S. Mróz, A. Mróz, A. Grudniewski, E. Bąk, Effective Debye Temperature of the (110) Ni Face for Different Azimuths, Physica Status Solidi (b) 117 (1983) 683.
32. P. Godowski, S. Mróz, Chemisorption of Molecular Sulphur (S2) on Ni(001), Thin Solid Films 111 (1984) 129.
33. A. Grudniewski, S. Mróz, Effective Debye Temperature and Rotational LEED Diagrams for the (001) and (111) Nickel Faces, J. Phys. C 18 (1985) 3387.
34. S. Mróz, E. Bauer, The Interaction of Gold with the Surface of a Cylindrical Tungsten Single Crystal, Surface Sci., 169 (1986) 394.
35. W. Doliński, S. Mróz, E. Chrzanowski, Influence of the Experimental Conditions on the Sulphur Segregation to the Nickel Surface and the Method of Eliminating this Influence, Acta Univ, Wratislaviensis No 937 (1986) 89.
36. S. Mróz, A. Mróz, Quantitative AES Analysis of PbTe and SnTe Samples with and without Matrix Effects Correction, Physica Status Solidi (a) 95 (1986) 407.
37. E. Chrzanowski, W. Doliński, S. Mróz, E. Woźniak, Investigation of Pb1-xSnxTe Crystal Surfaces by Quantitative AES, LEED and Kikuchi Pattern Observation, Physica Status Solidi (a) 98 (1986) 359.
38. W. Doliński, H. Nowicki, S. Mróz, J. Nowicka, Determination of Inelastic Mean Free Path of Electrons in Copper by Measurement and Calculation of Elastic Scattering Coefficient, Conf. on Surface Physics Proc. vol. I, Łódź (1986) 7.
39. S. Mróz, E. Chrzanowski, A. Mróz, Cz. Kozioł, Wykorzystanie wtórnej emisji elektronów, spektroskopii elektronów Augera i dyfrakcji powolnych elektronów do badania składu chemicznego i doskonałości powierzchni monokryształów krzemu, Materiały Elektroniczne 1 (57) (1987) 1.
40. A. Mróz, S. Mróz, An Electron Gun for Low Energy Electron Diffraction and Auger Electron Spectroscopy, Conf. on Surface Physics, Proc. vol. II, Łódź (1987) 265.
41. A. Mróz, S. Mróz, M. Zagórski, Simple Angle Resolved Auger Electron Spectroscopy System - Effective Rule for Measurement and Tests of Possibilities, Surface and Interface Analysis 12 (1988) 49.
42. S. Mróz, A. Mróz, K. Mroczkowska, Angle Resolved Auger Electron Spectroscopy (ARAES) for (110) Nickel Face Clean and Covered with Sulphur, in: Studies in Surface Science and Catalysis, vol. 40 (Elsevier, Amsterdam, 1988) 91.
43. S. Mróz, A Simple Detector of Weak Magnetic Fields, II Conf. on Surface Physics, Proc. vol. III, Łódź (1988) 129.
44. S. Mróz, A. Mróz, Angular Dependences in Auger Electron Emission from the (001) Nickel Face. I. Dependence of the Auger Signal on the Direction of the Primary Electron Beam, Surface Sci., 224 (1989) 235.
45. S. Mróz, A. Mróz, A. Wieczorek, V. Fritzsche, Angular Dependences in Auger Electron Emission from the (001) Nickel Face. II. Angular Distribution of Auger Electron Emission for Different Temperatures and Different Electron Energies in M2,3 VV Transition, Surface Sci., 224 (1989) 243.
46. W. Doliński, H. Nowicki, S. Mróz, Application of Elastic Peak Electron Spectroscopy to Determine Inelastic Mean Free Path of Electron in Copper and Silver, Surface and Interface Analysis, 11 (1988) 229.
47. W. Doliński, S. Mróz, M. Zagórski, Determination of Inelastic Mean Free Path of Electrons in Silver and Copper by Measurement and Calculation of the Elastic Scattering Coefficient, Surface Sci., 200 (1988) 361.
48. A. Mróz, S. Mróz, Angle Resolved Auger Electron Spectroscopy by Simple Adaptation of the LEED Optics, Acta Universitas Wratislaviensis No 1025 (1988) 277.
49. S. Mróz , H. Nowicki, Elastic Scattering of Electrons in Auger Electron Spectroscopy, II Conf. on Surface Physics, Proc. vol. III, Łódź (1988) p. 133.
50. M. Zagórski, S. Mróz, Computerized System for Investigation of Angular Distribution of Auger Electron Emission, II Conf. on Surface Physics, Proc. vol. III, Łódź (1988) 204.
51. S. Mróz, A. Mróz, A. Wieczorek, B. Stachnik, Angular Distribution of Auger Electron Emission from (001) and (111) Nickel Faces, Proc. 12th Int. Congress on X-ray Optics and Microanalysis, Kraków, (1989) 265.
52. S. Mróz, B. Stachnik, Angular Distribution of Auger Electron Emission from the (111) Nickel Face for particular energies in the Ni M2,3 VV Transition, Vacuum, 41, 7-9 (1990) 1581.
53. J. Palczyński, A. Marcińczak, W. Doliński, S. Mróz, Dependence of the Auger Signal in an RFA Analyser on the Modulation Voltage, Surface Science, 231 (1990) 76.
54. S. Mróz, Angular Distribution of Auger Electron Emission from Low-index Nickel Faces, Solid State Phenomena, 12 (1990) 139.
55. S. Mróz, B. Stachnik, M. Zagórski, A. Marcińczak, Preliminary Observations of Silver Adsorption on the Nickel (110) Face, 4th Conf. on Surface Physics, Proc. vol.VIII, Łódź (1990) 82.
56. J. Palczyński, S. Mróz, W. Doliński, Determination of Backscattering Factor in Auger Electron Spectroscopy for Copper, 4th Conf. on Surface Physics, Proc. vol. VIII, Łódź (1990) 119.
57. B. Stachnik, S. Mróz, Angular Distribution of M2,3 VV Auger Electron Emission from the (110) and (001) Faces of Copper Crystal, 4th Conf. on Surface Physics, Proc. vol. VIII Łódź (1990) 182.
58. V. Fritzsche, A. Chasse, S. Mróz, Angle resolved Auger Electron Spectra for a Ni(110) Surface: Calculations with the Reduced Angular Momentum Expansion, Surface Science 231 (1990) 59.
59. S. Mróz , B. Stachnik, Angular Distribution of the M2,3VV Auger Electron Emission from the (110), (001), and (111) Faces of Copper Crystal, Surface Science 247 (1991) 201.
60. J. Palczyński, W. Doliński, S. Mróz, Determination of Backscattering Factor for Quantitative Auger Analysis, Surface Science 247 (1991) 395.
61. W. Doliński, S. Mróz, J. Palczyński, B. Gruzza, P. Bondot , A. Porte, Determination of Inelastic Mean Free Path of Electrons in Noble Metals, Acta Physica Polonica A81, 2 (1992) 193.
62. S. Mróz , W. Doliński, Some Problems in Quantitative Auger Analysis of Metallic Alloys, Acta Physica Polonica A81, 2 (1992) 201.
63. S. Mróz, B. Stachnik, Very Thin Silver Layer Growth on the Cu(111) Face at Different Temperatures, Acta Physica Polonica A81, 2 (1992) 233.
64. S. Mróz, A. Kwiecień, Simple Electron Energy Analyzer for the ARAES System with the Electron Counting, Proc. 5th Conf. on Surface Physics, vol. X (1992) 56.
65. B. Stachnik, S. Mróz, Some Properties of Very Thin Silver Layer Adsorbed on the Cu(111) Face, Proc. 5th Conf. on Surface Physics, vol. X (1992) 118.
66. S. Mróz, M. Nowicki, Directional Auger Electron Spectroscopy (DAES) and Directional Elastic Peak Electron Spectroscopy (DEPES) in the Investigation of the Crystalline Structure of Surface Layers: the Ag/Cu(111) Interface, Surface Science 297 (1993) 66.
67. S. Mróz, F. Gołek, W. Doliński, E. Bauer, Properties of Ultra-thin CaF2 Layers on the W(110) Surface, Applied Surface Science 72 (1993) 341.
68. S. Mróz, Growth and Properties of Ultra-thin Silver Layers on the Cu(111) Face - the Influence of the Substrate Temperature, Vacuum 45 (1994) 357.
69. A.Stuck, M. Nowicki, S. Mróz, D. Naumovic, J. Osterwalder, High-energy Electron Diffraction on Cu(111) Measured with Low-energy Auger Electrons: Theory and Experiment, Surface Science 306 (1994) 21.
70. M. Zagórski, M. Nowicki, S. Mróz, AES Investigation of Growth of Very Thin Silver Films Deposited on the Copper and Nickel (110) Faces, Czechoslovak Journal of Physics 44 (1994) 295.
71. P. Bondot, A. Porte, B. Gruzza, L. Bideaux, S. Mróz, The Monte Carlo Method Applied to the Electrons Elastically Reflected by a Copper Sample, Vacuum 45, 2/3 (1994) 337.
72. S. Mróz, Physical Foundation of Quantitative Auger Analysis (invited review) Progress in Surface Science 46, 4 (1994) 377.
73. A. Mróz, S. Mróz, Temperature Effects in Directional Elastic Peak Electron Spectroscopy for the Cu(011) Face: Observation of the Surface Roughening Transition, Surface Science 320 (1994) 307.
74. S. Mróz, Z. Jankowski, Properties of Ultra-thin Silver Layers on the Ni(111) Face, Surface Science 322 (1995) 133.
75. S. Mróz, Directional Elastic Peak (DEPES) and Directional Auger (DAES) Electron Spectroscopies - New Tools in the Investigation of the Surface Layer Atomic Structure, Progress in Surface Science 48 (1995) 157. Grant KBN 2P302 113 05.
76. M. Nowicki, S. Mróz, Properties of Ultra-thin Silver Layers Deposited on the Cu(011) Face, Vacuum 46 (1995) 537.
77. M. Nowicki, S. Mróz, Properties of Ultra-thin Silver Layers Deposited on the Cu(001) Face, Vacuum 46 (1996) 445.
78. S. Mróz, Z. Jankowski, Properties of Ultra-thin Silver Films on the Nickel (001) Face. Surf. Sci. 349 (1996) 111..
79. S. Mróz, A. Mróz, M. Nowicki, On the Mechanism of Contrast Creation in Directional Auger Electron Spectroscopy (DAES), Journal of Electron Spectroscopy. 76 (1995) 635.
80. J. Wodecki, S. Mróz, Comparison of Processes Occuring during Silver Adsorption on Copper and Nickel at Elevated Temperatures, Acta Physica Polonica A89 (1996) 69.
81. S. Mróz, Studies of Composition of Surfaces and Interfaces with the use of Auger Electron Spectroscopy, Acta Physica Polonica A89 (1996) 183.
82. D. Zeze, L.Bideaux, B. Gruzza, F. Gołek, D. Dańko, S. Mróz, Retarding Field Analyser used in Elastic Peak Electron Spectroscopy, Vacuum 48 (1997) 399.
83. S. Mróz, H. Otop, Z. Jankowski, Growth and Atomic Structure of Ultra-thin Cobalt Layers on the Cu(111) Face Clean and Precovered with Lead, Surface Review and Letters 4 (1997) 1273.
84. S. Mróz, M. Nowicki, Z. Jankowski, Properties of Ultra-thin Silver Layers on Low-index Faces of Copper and Nickel, Progress in Surface Science 53 (1997) 197.
85. S. Mróz Directional Auger Electron Spectroscopy – Physical Foundations and Application, (invited review), Surface Review and Letters 4, (1997) 117.
86. S. Mróz, A. Mróz, Application of Directional AES for Nondestructive Depth Profile Analysis of an AuCu Alloy, Vacuum 48, (1997) 369.
87. S. Mróz, H. Otop, Z. Jankowski, On the Role of Pb in Epitaxial Growth of Thin Co Films on Cu(111), Surface Sci. 403-404 (1998) 263.
88. S. Mróz, Experimental Determination of the Composition Depth Profile of AuCu Alloys via Auger Electron Spectroscopy, Progress in Surface Science 59 (1998) 323.
89. S. Mróz, A. Mróz, Nondestructive Determination of the Concentration Profile in the Surface Layer of Au-Cu Alloy with the Use of Directional AES and Monte-Carlo Simulations, Vacuum 49 (1998) 101.
90. H. Otop, S. Mróz, Z. Jankowski, Silver Ultrathin Layer Growth on the Cu(111) Face at Temperatures from 130 to 570 K, Vacuum 54 (1999) 79.
91. S. Mróz, Z. Jankowski, M. Nowicki, Growth and Isothermal Desorption of Ultrathin Silver Layers on the Ni(111) Face at the Substrate Temperature from 180 to 900 K, Surface Science 454-456 (2000) 702.
92. S. Mróz, A. Mróz, Auger Electron Spectroscopy in the Investigation of Ultrathin Films in Molecular Beam Epitaxy, Thin Solid Films 367 (2000) 126.
93. H. Otop, S. Mróz, A. Mróz, A. Krupski, Design and Parameters of Home Made Sample Holders Enabling the Alignment, Rotations, Heating and Cooling of the Samples in Ultra-high Vacuum, Electron Technology 33 (2000) 437.
94. S. Mróz, A. Krupski, Composition of the First Two Atomic Layers in Au0.2Cu0.8 and Au0.8Cu0.2 Alloys, Vacuum 60 (2001) 307.
95. A. Krupski, S. Mróz, Properties of Ultrathin Pb Layers on the Ni(111) Face, Phys. Rev. B66 (2002) 035410.
96. A. Krupski, S. Mróz, Properties of ultrathin Sb Layers on the Ni(111) Face, Surface Review and Letters, 10 (2003) 65.
97. A. Krupski, S. Mróz, LEED Investigation of the Pb and Sb Ultrathin Layers Deposited on the Ni(111) face at T=150-900 K, Surface Review and Letters 10 (2003) 843.
98. S. Mróz, M. Nowicki, A. Krupski, Directional Elastic Peak Electron Spectroscopy: theoretical description and review of applications, Progress in Surface Science, 74 (2003) 109.
99. S. Mróz, Composition of the First Atomic Layers of (001)-oriented AuCu3 Crystal Measured with the Use of Directional Auger Electron Spectroscopy at 400 K < T < 1000 K , Vacuum 79 (2005) 241.
100. Ł. Rok, S. Mróz, E. Zych, M. Janik-Czachor, Short-range atomic order in the surface layer of sutter-deposited Al0.6W0.4 thin film investigated using directional eleastic peak electron spectroscopy, Journal of Non-Crystalline Solids 352 (2006) 2811.

Handbooks, dissertations.

1. S. Mróz, Właściwości powierzchni monokryształu niklu, Wydawnictwa Uniwersytetu Wrocławskiego, Wrocław, 1976 (habilitation thesis).
2. S. Mróz, Dyfrakcja powolnych elektronów, Wydawnictwo Uniwersytetu Wrocławskiego, Wrocław, 1981.
3. S. Mróz, Spektroskopia elektronów Augera, Wydawnictwo Uniwersytetu Wrocławskiego, Wrocław, 1992.

Patents

1. S. Mróz i S. Kaszczyszyn, „Mikrofotometr punktowy”, Urząd Patentowy PRL, Patent nr 64554 z dnia 10.03.1972 r.
2. S. Mróz i S. Kaszczyszyn, „Sposób wykonywania koncentrycznego zespołu metalowych siatek sferycznych i urządzenie do stosowania tego sposobu”, Urząd Patentowy PRL, Patent nr 66802 z dnia 20.12.1972 r.
3. S. Mróz, S. Kaszczyszyn, E. Chrzanowski i J. Kołaczkiewicz, „Głowica pomiarowa unipolarnego filtru mas”, Urząd Patentowy PRL, Patent nr 87292 z dnia 2.06.1975 r.

Another Works

1. S. Mróz, Badanie powierzchni monokrystalicznych metodą dyfrakcji powolnych elektronów, Prace Instytutu Technologii Elektronowej I (1973) 7.
2. E. Chrzanowski i S. Mróz, Unipolarny filtr mas - budowa, działanie i zastosowania, Prace Ośrodka Badawczo-Rozwojowego Elektroniki Próżniowej No 5 (1975) 15.
3. S. Mróz, Spektroskopia elektronów Augera - metoda badania powierzchni ciała stałego, Materiały Konferencji „Fizyka dla przemysłu”, Kraków, 1980, str. 57.
4. S. Mróz, Dyfrakcja powolnych elektronów - metoda badania struktury powierzchni kryształów, Delta nr 3/99/1982/ 1.
5. S. Mróz, Dyfrakcja powolnych elektronów i jej wykorzystanie w badaniu powierzchni ciała stałego, Zeszyty Naukowe Politechniki Świętokrzyskiej, Problemy Nauk Podstawowych 15, Kielce, 1983, str. 39.